CATEGORIES
Automated Dimension System
Automated Merging Inspection System
Burr Electrode Plate Measuring System
Cleanliness Inspection System
Cleanliness Inspection System
APIS (Automated Particle Inspection System, Cleanliness Testing System) is collected Particle Contamination (particle pollution) and ease of impurities and accurately measurable system from the Membrane Filter.
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The need for an inspection system cleanliness
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Particle Contamination (particle pollution) measurement has developed into the most important skills across all areas of the manufacturing industry
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Particle analysis and prevention of harmful ingredients to scarcity (particles) can have a devastating effect on the human body and machines
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There is a need for particle pollution, easy and accurate measurements possible impurities collected from domestic system Membrane Filter is increasing
Function
Title | Remark |
|---|---|
Support Specification | ISO 16232, ILST-STD-CC1246D, ISO 4406-4407,USP 788,VDA19,DIN50602,Custom Standard |
Recipe | Complete particle analysis and processing of specification criteria (default or setpoint) |
Scan map | Organize particle maps in real time while scanning filters |
Intelligent detection | Accurate detection of low contrast images |
Contrast correction | Software imbalance of light |
Entity estimation | When one object appears in several images, it is recognized as one object. |
Clustering | Visual report for cluster creation and color by object size or type |
Automatic calibration | One-click calibration complete |
Stage pattern | Supports square and circular stage pattern generation |
Scale display | Scale output to result image |
Custom features | Analyze / generate reports according to vendor characteristics |
Standalone Type
For Microscope
